The electrical characteristics of the CMOS Devices fabricated in the Instructional Cleanroom can be evaluated by using the probe stations and the testing instruments in the Device Characterization Lab of the IEN. A probe station is used to connect the test equipment to the devices directly on-wafer. This is accomplished by positioning probes with mechanical manipulators such that their tips rest on metal pads on the wafer. The probes and wires used in the Lab are suitable for relatively low-frequency and low-power measurements.
In addition, the characterization setup can be modified and configured to be suitable for individual devices (CMOS or otherwise) which are fabricated in other IEN cleanrooms or other facilities. Please use Request Assistance link for more information.
Featured measurements (not limited to) are described below with the unit-cell drawing of the current CMOS wafer design.