Device Characterization Lab is set up in Room 230A of the Joseph M. Pettit Building by the Georgia Tech IEN. It offers electrical testing services for both full size wafers and small pieces prior to packaging. The wafer-level device testing capability is enabled by two probe stations which are equipped with micromanipulated probe tips. The two probe stations in the lab are connected to multiple instruments, allowing DC parametric measurement such as I-V, C-V and inverter tests.