MCF - SUMS - Shared User Management System

Dimension and Conductivity

c-AFM scan of the height(left) and conductivity(right) of porous alumina

AFM image of a functionalized SW-CNT

Composition and Dimension

ToF-SIMS image of a GaN photodiode

Lecture- Scanning Transmission Electron Microscopy

The Scanning Transmission Electron Microscope (STEM) has evolved from a niche research-lab apparatus to arguably the leading electron microscopy analysis technique humanity has devised. In this presentation, I will discuss general principals of the STEM and aberration correction with an emphasis on making the concepts readily accessible. Then I will discuss examples of how the STEM is being or has been used to obtain data from nearly every conceivable signal available, including three-dimensional data.