IONTOF Time-of-Flight SIMS:
IEN/IMAT Materials Characterization Facility
Status:
Available
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Equipment Description
The ToF-SIMS system uses Bi ions to directly chemically image surfaces. Sputtering by O or Cs ion beams allows depth profiles up to ~ 1 micron. Atomic masses from 1 up to >5000 amu (i.e. H up to large molecules) can be detected with a high mass resolution. The system can detect trace elements down to concentrations of a few parts per million. The software can produce 2-D and 3 -D chemical reconstructions of analyzed areas. Lateral resolution is as small as ~300 nm, vertical resolution is ~ 2nm.
Institute Georgia Tech
Department IEN/IMAT Materials Characterization Facility
Reservation mode Schedule
Days Past To Load:
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Others' Time
How to schedule time on desktop
When you first view the calendar on your dashboard, it will show you your scheduled time along with any scheduled down events for tools you are a member of.  If you view the calendar on a tool page it will show you the above plus any scheduled events for that tool.  On your dashboard to select a tool click on the dropdown box at the top of the calendar section.

  Once you have selected a tool, or are on a tool page, to make a new reservation click and drag on the calendar from when you want your scheduled time to star to when you want your scheduled time to end.  This will open the schedule detail screen so that you can modify the schedule details and then save.
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